Ming-Kai Tse
6Patents
3h-index
4Co-inventors
50Inventor score
Filing activity: Oct 30, 1980 → Apr 12, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4443764A | Method for non-destructive detection and characterization of flaws | Physics | 10 | Expired |
| US4662228A | Automated interfacial testing system | Physics | 4 | Expired |
| US5929640A | Automated stationary/portable test system for photoconductive drums | Physics | 4 | Expired |
| US6469513B1 | Automated stationary/portable test system for applying a current signal to a dielectric material being tested | Physics | 3 | Expired |
| US6670814B2 | Semi-insulating material testing and optimization | Physics | 0 | Expired |
| USD461731S1 | Palm based photosensor instrumentation | General | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.