Method for non-destructive detection and characterization of flaws
US4443764A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 1980 |
| Grant date | Apr 17, 1984 |
| Priority date | — |
| Expiry date | Oct 30, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/61
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for the nondestructive testing and evaluation of insulating materials is disclosed. The method comprises applying an electrostatic charge pattern to one surface of the material; providing an electrode on a second surface opposite said one surface, said electrode being at an electrical potential lower than said one surface so that the electrostatic charge can decay through said material; allowing the charge pattern to decay for a predetermined period of time; and determining the residual charge pattern on said one surface after said period. The method preferably further comprises heating the material above room temperature which can enhance the results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.