Muid Mufti
4Patents
4h-index
8Co-inventors
36Inventor score
Filing activity: Dec 22, 1995 → Mar 26, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6650779B2 | Method and apparatus for analyzing an image to detect and identify patterns | Physics | 187 | Expired |
| US5815198A | Method and apparatus for analyzing an image to detect and identify defects | Physics | 136 | Expired |
| US5809162A | Surface analysis system and method | Physics | 22 | Expired |
| US5923781A | Segment detection system and method | Physics | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.