Method and apparatus for analyzing an image to detect and identify patterns

US6650779B2 · kind B2 · utility

Assignee

• Georgia Tech Research Corporation · US

Inventors

• George J. Vachtesvanos · Marietta, US
• Lewis J. Dorrity · Marietta, US
• Peng Wang · Shandong, CN
• Javier Echauz · Roswell, US
• Muid Mufti · Atlanta, US

Key dates

• Filing date: Mar 26, 1999
• Grant date: Nov 18, 2003
• Expiry date: Mar 26, 2019

Classification

• Technology area (CPC G): Physics
• CPC primary: G06V2201/06
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and apparatus is provided which analyzes an image of an object to detect and identify defects in the object utilizing multi-dimensional wavelet neural networks. “The present invention generates a signal representing part of the object, then extracts certain features of the signal. These features are then provided to a multidimensional neural network for classification, which indicates if the features correlate with a predetermined pattern. This process of analyzing the features to detect and identify predetermined patterns results in a robust fault detection and identification system which is computationally efficient and economical because of the learning element contained therein which lessens the need for human assistance.”