Murray Weiser
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Feb 24, 1986 → Feb 24, 1986
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4860329A | X-ray fluorescence thickness measuring device | Physics | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.