X-ray fluorescence thickness measuring device
US4860329A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 1986 |
| Grant date | Aug 22, 1989 |
| Priority date | — |
| Expiry date | Feb 24, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray fluorescence thickness measuring devise includes a primary X-ray beam collimation and workpiece positioning system that markedly increases the detectable fluorescent X-radiation from diverse specimen calibration standards and workpieces subjected to measurement. The positioning system includes an optical viewing system that provides a video signal image of the specimen surface prior to and during specimen radiation without hazard to the unit operator and independent of the collimator bore selected. A further feature of the measuring device is that it includes a system which assures repetitive and accurate positioning of a selected collimator relative to the axis of the X-ray beam to obtain maximum beam transmission therethrough.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.