Nicolas K. Eib
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Dec 30, 2005 → Dec 30, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7458060B2 | Yield-limiting design-rules-compliant pattern library generation and layout inspection | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.