Inventor · Shanghai, CN

Ningning Pan

1Patents
0h-index
2Co-inventors
16Inventor score

Filing activity: Sep 3, 2009 → Sep 3, 2009

Most-cited inventions

PatentTitleAreaCited byStatus
US9200998B2 Method and apparatus for ellipsometry measurement Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.