Nir Ben David
1Patents
0h-index
7Co-inventors
19Inventor score
Filing activity: Sep 8, 2021 → Sep 8, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12131959B2 | Systems and methods for improved metrology for semiconductor device wafers | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.