Noel H. Johnson
8Patents
5h-index
13Co-inventors
60Inventor score
Filing activity: Mar 27, 1986 → Jun 19, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4984902A | Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing | Physics | 69 | Expired |
| US4969748A | Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing | Physics | 46 | Expired |
| US7012538B2 | Heating element condition monitor | Electricity | 16 | Expired |
| US4728869A | Pulsewidth modulated pressure control system for chemical vapor deposition apparatus | Emerging Cross-Sectional Technologies | 13 | Expired |
| US7335864B2 | Magnetic field reduction resistive heating elements | Electricity | 5 | Active |
| US7825672B2 | High accuracy in-situ resistance measurements methods | Physics | 5 | Active |
| US7368832B2 | Circuit and fault tolerant assembly including such circuit | Emerging Cross-Sectional Technologies | 3 | Expired |
| US6956489B2 | Heating element condition monitor | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.