High accuracy in-situ resistance measurements methods
US7825672B2 · kind B2 · utility
5Cited by
14References
19Claims
0Family size
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Key dates
| Filing date | Jun 19, 2006 |
| Grant date | Nov 2, 2010 |
| Priority date | — |
| Expiry date | Jun 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods to determine an instantaneous resistance value of an electric circuit and a measurement system to determine an instantaneous resistance value of an electric circuit are disclosed. Exemplary embodiments of the method measure an in-situ instantaneous voltage of the circuit and an in-situ instantaneous current of the circuit and calculate the instantaneous resistance. Optional temperature measurement can be included in the method and the calculated instantaneous resistance related to the measured temperature. The method can be applied to phase angle fired loads and to zero-cross (time proportioned) loads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.