Norik Janunts
2Patents
0h-index
5Co-inventors
21Inventor score
Filing activity: Aug 2, 2019 → Jun 19, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11162976B2 | Assembly for detecting the intensity distribution of components of the electromagnetic field in beams of radiation | Physics | 0 | Active |
| US11906579B2 | Wafer-level test method for optoelectronic chips | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.