Oksen Baris
3Patents
2h-index
14Co-inventors
31Inventor score
Filing activity: Jul 27, 2015 → Jan 29, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9518934B2 | Wafer defect discovery | Electricity | 9 | Active |
| US9922269B2 | Method and system for iterative defect classification | Electricity | 3 | Active |
| US10712289B2 | Inspection for multiple process steps in a single inspection process | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.