Patrick Mauvais
4Patents
3h-index
8Co-inventors
47Inventor score
Filing activity: Sep 24, 1990 → Jul 30, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5152176A | Process and apparatus for determining the quality of impurities in a gas by chromatography in gas phase and utilization for measuring the quantity of doping impurities in silane | Physics | 45 | Expired |
| US5705816A | Process and device for analyzing traces of impurities in a gas sample by means of a diode laser | Physics | 13 | Expired |
| US6341521B1 | Process and device for measuring the amount of impurities in a gas sample to be analyzed | Physics | 7 | Expired |
| US9977005B2 | Gas sampling device and filling station comprising such a device | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.