Process and device for measuring the amount of impurities in a gas sample to be analyzed
US6341521B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 12, 1999 |
| Grant date | Jan 29, 2002 |
| Priority date | — |
| Expiry date | Oct 12, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/399
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a process for measuring the amount of impurities in a gas sample filling a laser absorption spectroscopy analysis cell. The process includes calculating the value of a characteristic representative of the absorbance of the gas sample, from a measurement of the gas sample at a single given pressure, and quantifying the impurities on the basis of a predetermined law for the variation of the characteristic as a function of the amount of impurities. The characteristic is the ratio of the difference between the luminous intensity (Iana) of a light beam transmitted through the gas and the luminous intensity (Iref) of the incident beam to the luminous intensity (Iref) of the incident beam. The impurities are quantified on the basis of a value of the coefficient of proportionality between the amount of impurities and the characteristic, determined on the basis of a table of variation of the characteristic as a function of pressure, for a given amount of impurities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.