Patrick Miller
3Patents
1h-index
12Co-inventors
45Inventor score
Filing activity: Sep 17, 2001 → Feb 5, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6549150B1 | Integrated test structure and method for verification of microelectronic devices | Electricity | 8 | Expired |
| US10955248B2 | Geo-location structure mapping | Physics | 0 | Active |
| US11733047B2 | Geo-location structure mapping | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.