Pavan Kumar
4Patents
2h-index
20Co-inventors
40Inventor score
Filing activity: Sep 27, 2013 → May 4, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11270430B2 | Wafer inspection using difference images | Physics | 3 | Active |
| US9996942B2 | Sub-pixel alignment of inspection to design | Physics | 3 | Active |
| US10572991B2 | System and method for aligning semiconductor device reference images and test images | Physics | 2 | Active |
| US9710959B2 | Compressed 3D graphics rendering exploiting psychovisual properties | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.