Peter A. de Kloe
2Patents
0h-index
7Co-inventors
21Inventor score
Filing activity: Jan 22, 2013 → Jun 24, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8835842B2 | Systems and methods for investigating a characteristic of a material using electron microscopy | Electricity | 0 | Active |
| US8735815B2 | Method and apparatus for electron pattern imaging | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.