Peter Poechmüller
2Patents
1h-index
7Co-inventors
27Inventor score
Filing activity: Mar 6, 2002 → Mar 26, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7117404B2 | Test circuit for testing a synchronous memory circuit | Physics | 3 | Expired |
| US6957373B2 | Address generator for generating addresses for testing a circuit | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.