Philip Brundage
3Patents
1h-index
4Co-inventors
33Inventor score
Filing activity: Aug 14, 2014 → Jun 21, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9709600B2 | Circuit probe for charged particle beam system | Electricity | 2 | Active |
| US11749496B2 | Protective shutter for charged particle microscope | Electricity | 0 | Active |
| US10930514B2 | Method and apparatus for the planarization of surfaces | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.