Philipp Huethwohl
2Patents
1h-index
9Co-inventors
30Inventor score
Filing activity: Sep 9, 2019 → Apr 1, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10901391B1 | Multi-scanning electron microscopy for wafer alignment | Emerging Cross-Sectional Technologies | 2 | Active |
| US11728130B2 | Method of recording an image using a particle microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.