Philipp Jaschinsky
2Patents
0h-index
7Co-inventors
21Inventor score
Filing activity: Nov 17, 2015 → Jul 5, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9966315B2 | Advanced process control methods for process-aware dimension targeting | Electricity | 0 | Active |
| US9798244B2 | Methods, apparatus, and systems for minimizing defectivity in top-coat-free lithography and improving reticle CD uniformity | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.