Rahul Hakoo
1Patents
0h-index
2Co-inventors
16Inventor score
Filing activity: Dec 24, 2008 → Dec 24, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8185338B2 | Low pin interface testing module | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.