Inventor · Haar, DE

Rainer Brodmann

2Patents
2h-index
5Co-inventors
41Inventor score

Filing activity: Dec 3, 1986 → Aug 25, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US4763006A Device determining surface element inclination angle for the optical detection of form errors of a low order Physics 5 Expired
US10180316B2 Method and device for the contactless assessment of the surface quality of a wafer Physics 3 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.