Rainer Schramm
4Patents
3h-index
4Co-inventors
43Inventor score
Filing activity: May 15, 2003 → Mar 27, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7015418B2 | Method and system for calibrating a laser processing system and laser marking system utilizing same | Electricity | 83 | Expired |
| US7067763B2 | High speed, laser-based marking method and system for producing machine readable marks on workpieces and semiconductor devices with reduced subsurface damage produced thereby | Electricity | 21 | Expired |
| US7315361B2 | System and method for inspecting wafers in a laser marking system | Performing Operations; Transporting | 4 | Expired |
| US9651463B2 | Apparatus and method for producing analysis samples | Mechanical Engineering; Lighting; Heating | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.