Ramaprasad Kulkarni
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Sep 17, 2019 → Sep 17, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11468553B2 | System and method for determining type and size of defects on blank reticles | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.