Ran Schleyen
8Patents
1h-index
16Co-inventors
40Inventor score
Filing activity: Mar 16, 2015 → May 23, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11151710B1 | Automatic selection of algorithmic modules for examination of a specimen | Physics | 2 | Active |
| US9490101B2 | System and method for scanning an object | Electricity | 1 | Active |
| US11449711B2 | Machine learning-based defect detection of a specimen | Physics | 1 | Active |
| US11379972B2 | Detecting defects in semiconductor specimens using weak labeling | Physics | 1 | Active |
| US11790515B2 | Detecting defects in semiconductor specimens using weak labeling | Physics | 0 | Active |
| US10101206B2 | Spectral imaging method and system | Physics | 0 | Active |
| US9900562B2 | System and method for light-field imaging | Electricity | 0 | Active |
| US10340116B1 | Imaging an area that includes an upper surface and a hole | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.