Ran Vered
3Patents
1h-index
10Co-inventors
41Inventor score
Filing activity: Feb 22, 2006 → Jan 20, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7428850B2 | Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system | Electricity | 4 | Active |
| US11762260B2 | Laser beams methods and systems | Electricity | 0 | Active |
| US11646543B2 | Optical phased array dynamic beam shaping with noise correction | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.