Ran YACOBY
4Patents
0h-index
6Co-inventors
24Inventor score
Filing activity: Jan 6, 2021 → Nov 13, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12321102B2 | Machine and deep learning methods for spectra-based metrology and process control | Physics | 0 | Active |
| US11874606B2 | System and method for controlling measurements of sample's parameters | Electricity | 0 | Active |
| US11815819B2 | Machine and deep learning methods for spectra-based metrology and process control | Physics | 0 | Active |
| US11747740B2 | Self-supervised representation learning for interpretation of OCD data | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.