Robert Shrank
2Patents
2h-index
6Co-inventors
30Inventor score
Filing activity: Oct 10, 2003 → Mar 31, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7548105B2 | Method and apparatus for source synchronous testing | Physics | 4 | Active |
| US7275188B1 | Method and apparatus for burn-in of semiconductor devices | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.