Patent · US Active

Method and apparatus for source synchronous testing

US7548105B2 · kind B2 · utility

4Cited by

8References

4Claims

0Family size

Assignee

Integrated Device Technology, Inc. · US

Inventors

Robert Shrank · Salinas, US
Moussa Sobaiti · Salinas, US
Prashant Shamarao · Duluth, US
Brian Butka · Alpharetta, US
Jim K. Harris · Loganville, US

Key dates

Filing date	Mar 31, 2006
Grant date	Jun 16, 2009
Priority date	—
Expiry date	Jul 20, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31727
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and apparatus for source synchronous testing have been disclosed. In one case a data signal is delayed and a selectively activated delay is applied to a clock. This allows the clock to be positioned before the data and also after the data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.