Robert Trauner
4Patents
1h-index
7Co-inventors
33Inventor score
Filing activity: Oct 12, 2017 → Oct 21, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10345250B2 | Method of inspecting a sample with a charged particle beam device, and charged particle beam device | Electricity | 1 | Active |
| US11610755B2 | Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample | Electricity | 0 | Active |
| US11687008B2 | Method for automated critical dimension measurement on a substrate for display manufacturing, method of inspecting a large area substrate for display manufacturing, apparatus for inspecting a large area substrate for display manufacturing and method of operating thereof | Electricity | 0 | Active |
| US11195691B2 | Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.