Robert Weidner
2Patents
1h-index
8Co-inventors
37Inventor score
Filing activity: Mar 14, 2003 → Sep 27, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6883150B2 | Automatic manufacturing test case generation method and system | Physics | 9 | Expired |
| US11847463B2 | Masked multi-lane instruction memory fault handling using fast and slow execution paths | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.