Patent · US Expired

Automatic manufacturing test case generation method and system

US6883150B2 · kind B2 · utility

9Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 14, 2003
Grant dateApr 19, 2005
Priority date
Expiry dateMay 26, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31835
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Automatic manufacturing test case generation mechanism receives a plurality of design verification test cases (DVTCs) from one or more sources and based thereon automatically generates manufacturing test cases (MTCs). Each of the manufacturing test cases (MTCs) generated by the automatic manufacturing test includes at least a first design verification test case and a second design verification test case.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.