Robin C. Sarma
3Patents
2h-index
4Co-inventors
27Inventor score
Filing activity: Jun 14, 2002 → Jul 1, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6870375B2 | System and method for measuring a capacitance associated with an integrated circuit | Physics | 13 | Expired |
| US6788074B2 | System and method for using a capacitance measurement to monitor the manufacture of a semiconductor | Electricity | 10 | Expired |
| US6856143B2 | System and method for measuring a capacitance of a conductor | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.