Romano Schmidt
1Patents
0h-index
1Co-inventors
16Inventor score
Filing activity: Jan 22, 2019 → Jan 22, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10955468B2 | Wafer probe resumption of die testing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.