Inventor · Aviel, IL

Royi Levav

2Patents
2h-index
7Co-inventors
33Inventor score

Filing activity: Mar 5, 2008 → Mar 15, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US7724375B1 Method and apparatus for increasing metrology or inspection tool throughput Physics 7 Active
US9170412B2 Objective lens changer mechanism suitable for use in a compact microscopy system Physics 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.