Russell M. Singleton
3Patents
2h-index
6Co-inventors
33Inventor score
Filing activity: Jan 24, 1979 → Feb 22, 1984
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4644172A | Electronic control of an automatic wafer inspection system | Electricity | 169 | Expired |
| US4618938A | Method and apparatus for automatic wafer inspection | Physics | 167 | Expired |
| US4196353A | Microradiographic microsphere manipulator | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.