Saar Shabtay
9Patents
1h-index
11Co-inventors
40Inventor score
Filing activity: Oct 23, 2014 → Jun 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9286675B1 | Iterative defect filtering process | Physics | 13 | Active |
| US10871451B2 | System, method and computer program product for object examination | Physics | 1 | Active |
| US10408764B2 | System, method and computer program product for object examination | Physics | 1 | Active |
| US11360030B2 | Selecting a coreset of potential defects for estimating expected defects of interest | Physics | 0 | Active |
| US11592400B2 | System, method and computer program product for object examination | Physics | 0 | Active |
| US10818000B2 | Iterative defect filtering process | Physics | 0 | Active |
| US10605745B2 | Guided inspection of a semiconductor wafer based on systematic defects | Physics | 0 | Active |
| US10049441B2 | Iterative defect filtering process | Physics | 0 | Active |
| US11940390B2 | Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.