Samson DeKey
12Patents
11h-index
13Co-inventors
61Inventor score
Filing activity: May 4, 1994 → Aug 3, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6173438A | Embedded graphical programming system | Physics | 209 | Expired |
| US6715139B1 | System and method for providing and displaying debugging information of a graphical program on a first computer during execution of the graphical program on a second computer | Physics | 69 | Expired |
| US5847955A | System and method for controlling an instrumentation system | Emerging Cross-Sectional Technologies | 55 | Expired |
| US5717614A | System and method for handling events in an instrumentation system | Physics | 49 | Expired |
| US5724272A | Method and apparatus for controlling an instrumentation system | Physics | 44 | Expired |
| US6229921A | Pattern matching system and method with improved template image sampling using low discrepancy sequences | Physics | 38 | Expired |
| US5771388A | System and method for mapping driver level event function calls from a process-based driver level program to a session-based instrumentation control driver level system | Physics | 36 | Expired |
| US5710727A | System and method for creating resources in an instrumentation system | Physics | 35 | Expired |
| US5640572A | System and method for mapping driver level event function calls from a process-based driver level program to a session-based instrumentation control driver level system | Physics | 27 | Expired |
| US6370270B1 | System and method for sampling and/or placing objects using low discrepancy sequences | Physics | 24 | Expired |
| US6222940A | Pattern matching system and method which detects rotated and scaled template images | Physics | 14 | Expired |
| US6219452A | Pattern matching system and method which performs local stability analysis for improved efficiency | Physics | 11 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.