Satheesh Jeyaraman
3Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Jul 18, 2013 → Aug 22, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10152784B2 | System and method for detecting defects in a component | Physics | 5 | Active |
| US10845339B2 | Method and system for determination of geometric features in objects | Physics | 0 | Active |
| US10393705B2 | Method and system for determination of geometric features in objects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.