System and method for detecting defects in a component

US10152784B2 · kind B2 · utility

Assignee

• General Electric Company · US

Inventors

• Venkata Vijayaraghava Nalladega · Watervliet, US
• Thomas James Batzinger · Burnt Hills, US
• Yuri Alexeyevich Plotnikov · Niskayuna, US
• Shyamsunder Tondanur Mandayam · Savanuru, IN
• Bryon Edward Knight · Charlton, US
• Satheesh Jeyaraman · Savanuru, IN
• Esha SenGupta · Bengaluru, IN

Key dates

• Filing date: Jun 30, 2016
• Grant date: Dec 11, 2018
• Expiry date: Nov 25, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/20221
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.