Inventor · Nampa, ID, US

Scott A. Earnest

1Patents
1h-index
3Co-inventors
25Inventor score

Filing activity: May 1, 1995 → May 1, 1995

Most-cited inventions

PatentTitleAreaCited byStatus
US5528603A Apparatus and method for testing an integrated circuit using a voltage reference potential and a reference integrated circuit Physics 17 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.