Seong Won Kwon
11Patents
3h-index
21Co-inventors
60Inventor score
Filing activity: Aug 14, 1992 → Mar 1, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7927497B2 | Integrated thin-film solar cells and method of manufacturing thereof and processing method of transparent electrode for integrated thin-film solar cells and structure thereof, and transparent substrate having processed transparent electrode | Emerging Cross-Sectional Technologies | 8 | Active |
| US8449782B2 | See-through-type integrated thin-film solar cell, method of manufacturing the same and method of electrically series connecting unit cells thereof | Emerging Cross-Sectional Technologies | 3 | Active |
| US7416758B2 | Slit coater | Performing Operations; Transporting | 3 | Expired |
| US5524183A | Data transmitting apparatus for the thermal print head of high density | Electricity | 3 | Expired |
| US8153885B2 | Integrated thin-film solar cell and method of manufacturing the same | Emerging Cross-Sectional Technologies | 1 | Active |
| US8168882B2 | Integrated thin-film solar cell and method of manufacturing the same | Emerging Cross-Sectional Technologies | 0 | Active |
| US11137335B2 | Method for evaluating fluid flow characteristics of lens-free CMOS optical array sensor package module having flow channel | Physics | 0 | Active |
| US8148626B2 | Integrated thin-film solar cell and method of manufacturing the same | Emerging Cross-Sectional Technologies | 0 | Active |
| US7914843B2 | Slit coater having pre-applying unit and coating method using the same | Performing Operations; Transporting | 0 | Active |
| US12159473B2 | Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same | Physics | 0 | Active |
| US11624899B2 | Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.