Serkan Ertekin
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Aug 22, 2005 → Aug 22, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7206706B2 | Inspection method and system using multifrequency phase analysis | Physics | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.