Inspection method and system using multifrequency phase analysis
US7206706B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2005 |
| Grant date | Apr 17, 2007 |
| Priority date | — |
| Expiry date | Aug 22, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9086
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.