Shan Gu
2Patents
1h-index
9Co-inventors
37Inventor score
Filing activity: Dec 19, 2003 → Jun 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6959426B2 | Cost-effective scan architecture and a test application scheme for scan testing with non-scan test power and test application cost | Physics | 7 | Expired |
| US12045260B2 | Data reorganization | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.