Shan Zhang
6Patents
0h-index
21Co-inventors
41Inventor score
Filing activity: May 1, 2012 → May 9, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11852657B2 | Tester and method for calibrating probe card and device under testing (DUT) | Physics | 0 | Active |
| US12047058B2 | IGBT driving circuit and power conversion device | Emerging Cross-Sectional Technologies | 0 | Active |
| US12341343B2 | Control method for energy storage system and apparatus, energy storage system, and energy storage device | Electricity | 0 | Active |
| US8954494B2 | Method and system for synchronizing operations of multiple groups | Electricity | 0 | Active |
| US11109171B2 | Semiconductor device and manufacture thereof | Electricity | 0 | Active |
| US10587971B2 | Semiconductor device and manufacture thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.