Shinji MOTOI
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Aug 25, 2000 → Aug 25, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6480016B1 | Tester, a test system, and a testing method for a semiconductor integrated circuit | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.