Simon Dawes
3Patents
0h-index
5Co-inventors
27Inventor score
Filing activity: Nov 29, 2018 → Oct 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11852975B2 | Electron beam lithography with dynamic fin overlay correction | Electricity | 0 | Active |
| US12099304B2 | Electron beam lithography with dynamic fin overlay correction | Electricity | 0 | Active |
| US12253499B2 | Thin-layer chromatography system and method for assessing analyte concentrations in samples | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.